100 Gigabit Ethernet Testing
The 100Gb Ethernet LR4 and ER4 implementations are both four channel architectures with 25Gb/s data rates. Testing all of the lanes with independently programmable data that may be phase shifted allows the entire system to be tested over a wide range of conditions. This flexibility enables the module and system designer to test with a high degree of confidence, addressing key issues such as electrical and optical cross-talk.
Picosecond Pulse Labs’ new Pattern Pro serial data instruments offer a complete line of products targeted for high-speed test applications. The SDG Model 12070 30Gb/s Pattern Generator and the Model SDA 13020 32Gb/s Error Detector provide an excellent solution for the challenges of 100Gb Ethernet testing. 100Gb Ethernet applications utilize multi-channel architectures and optical schemes that necessitate test equipment that is up to the challenge.
Picosecond’s 30Gb/s products are specifically designed with these challenges in mind, addressing them with a unique combination of instrument architectures (multi-channel), performance (high quality output), features (built-in jitter insertion, adjustable delay), and ease of use.
Application Note: AN-27
Recommended Test System Configuration:
SDG12070-4: Quad Channel 30 G Programmable Pattern Generator or SDG12072: Quad Channel 32 G Programmable Pattern Gen. with 8 ps rise time
SDG12030-2: Dual Channel 32 G Programmable Error Detector
Datasheet: 30G BERT system v1
